• DocumentCode
    2722548
  • Title

    Complex dynamics of epileptic EEG

  • Author

    Kannathal, N. ; Puthusserypady, Sadasivan K. ; Min, Lim Choo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    604
  • Lastpage
    607
  • Abstract
    Electroencephalogram (EEG) - the recorded representation of electrical activity of the brain contain useful information about the state of the brain. Recent studies indicate that nonlinear methods can extract valuable information from neuronal dynamics. We compare the dynamical properties of EEG signals of healthy subjects with epileptic subjects using nonlinear time series analysis techniques. Chaotic invariants like correlation dimension (D2) , largest Lyapunov exponent (λ1), Hurst exponent (H) and Kolmogorov entropy (K) are used to characterize the signal. Our study showed clear differences in dynamical properties of brain electrical activity of the normal and epileptic subjects with a confidence level of more than 90%. Furthermore to support this claim fractal dimension (FD) analysis is performed. The results indicate reduction in value of FD for epileptic EEG indicating reduction in system complexity.
  • Keywords
    Lyapunov methods; correlation methods; electroencephalography; entropy; fractals; medical signal processing; neurophysiology; time series; Hurst exponent; Kolmogorov entropy; brain electrical activity; chaotic invariants; correlation dimension; epileptic EEG; fractal dimension; largest Lyapunov exponent; neuronal dynamics; nonlinear time series analysis; Brain; Chaos; Data mining; Electroencephalography; Entropy; Epilepsy; Fractals; Performance analysis; Signal analysis; Time series analysis; Correlation dimension; Fractal dimension; Hurst exponent; Kalmogorov entropy; largest Lyapunov exponent;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403230
  • Filename
    1403230