DocumentCode :
2722567
Title :
Fast electrical-thermal co-simulation using multigrid method for 3D integration
Author :
Xie, Jianyong ; Swaminathan, Madhavan
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
651
Lastpage :
657
Abstract :
In this paper, a fast electrical-thermal co-simulation method based on multigrid approach is proposed for simulating 3D systems. Using the proposed approach, accurate voltage/current distribution with temperature effect as well as temperature distribution with Joule heating effect can be obtained efficiently. By ensuring smoothly stretched gridding between die region and package region, fast convergence of multigrid method can be reached for both DC voltage drop and thermal simulations. The effect of nonuniform gridding on the convergence of multigrid is studied. The temperature effect on voltage drop and Joule heating effect on localized hotspot are discussed.
Keywords :
circuit simulation; current distribution; differential equations; integrated circuit modelling; integrated circuit packaging; temperature distribution; three-dimensional integrated circuits; voltage distribution; 3D integration; 3D system simulation; DC voltage drop; Joule heating effect; current distribution; die region; fast electrical-thermal co-simulation method; multigrid method; nonuniform gridding effect; package region; temperature distribution; temperature effect; voltage distribution; Convergence; Equations; Heating; Materials; Mathematical model; Solid modeling; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6248901
Filename :
6248901
Link To Document :
بازگشت