DocumentCode
2722567
Title
Fast electrical-thermal co-simulation using multigrid method for 3D integration
Author
Xie, Jianyong ; Swaminathan, Madhavan
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
651
Lastpage
657
Abstract
In this paper, a fast electrical-thermal co-simulation method based on multigrid approach is proposed for simulating 3D systems. Using the proposed approach, accurate voltage/current distribution with temperature effect as well as temperature distribution with Joule heating effect can be obtained efficiently. By ensuring smoothly stretched gridding between die region and package region, fast convergence of multigrid method can be reached for both DC voltage drop and thermal simulations. The effect of nonuniform gridding on the convergence of multigrid is studied. The temperature effect on voltage drop and Joule heating effect on localized hotspot are discussed.
Keywords
circuit simulation; current distribution; differential equations; integrated circuit modelling; integrated circuit packaging; temperature distribution; three-dimensional integrated circuits; voltage distribution; 3D integration; 3D system simulation; DC voltage drop; Joule heating effect; current distribution; die region; fast electrical-thermal co-simulation method; multigrid method; nonuniform gridding effect; package region; temperature distribution; temperature effect; voltage distribution; Convergence; Equations; Heating; Materials; Mathematical model; Solid modeling; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6248901
Filename
6248901
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