Title :
Test features of the MC145472 ISDN U-transceivers
Author :
Bonet, L. ; Ganger, J. ; Girardeau, J. ; Greaves, C. ; Pendleton, M. ; Yatim, D.
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
The design of a single-chip implementation of a 2B1Q ISDN (integrated services digital network) U transceiver that meets the ANSI T1.601 standards has been completed. The MC145472 was designed with testability in mind and to be consistent with Motorola´s design-for-manufacturability goals. The authors describe in detail the design-for-testability techniques specifically intended for the IC manufacturer production test and other ad hoc test/diagnostic structures for the customer to use in evaluating system performance. A global test strategy for testing the ISDN U transceiver is presented. The test features have been used extensively not only for testing the device in the production environment but also for conducting evaluations and design verification experiments during the chip debugging phase. The test features described are well integrated with the architecture of the chip, thus minimizing incremental cost
Keywords :
ISDN; automatic testing; electronic equipment testing; production testing; transceivers; 2B1Q ISDN; IC manufacturer production test; MC145472 ISDN U-transceivers; Motorola; chip debugging; cost; design verification; design-for-manufacturability; design-for-testability; integrated services digital network; ANSI standards; Costs; Debugging; ISDN; Integrated circuit testing; Manufacturing; Production systems; System performance; System testing; Transceivers;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114002