Title :
Fast and accurate testing of ISDN S/T interface devices using pseudo error rate techniques
Author :
Sprinkle, Billy W.
Author_Institution :
Northern Telecom, Research Triangle Park, NC, USA
Abstract :
A procedure for extrapolating bit error rates (BERs) from a digital data receiver´s ability to decode degraded data properly has been developed for ISDN (integrated services digital network) S/T interface loops. Three methods of signal degradation are described: noise addition, jitter addition, and intersymbol interference. It is shown that pseudo-error-rate (PER) testing reduces test time significantly and can be easily adapted to other forms of digital transmission. 1-s PER tests replacing 2.5-min BER testing are discussed. Results indicate a high degree of repeatability and confidence levels exceeding 90%. PER testing of ISDN S/T interface devices will reduce functional test time to a few seconds or less compared with several minutes for BER testing
Keywords :
ISDN; automatic testing; electric noise measurement; electronic equipment testing; error analysis; intersymbol interference; ISDN S/T interface; bit error rates; degraded data; digital transmission; functional test time; integrated services digital network; intersymbol interference; jitter addition; noise addition; pseudo error rate; pseudo-error-rate; repeatability; signal degradation; test time; Bit error rate; Decoding; Degradation; Error analysis; ISDN; Jitter; Repeaters; Shift registers; System testing; Telecommunications;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114003
