DocumentCode :
2722944
Title :
Detecting mutually-salient landmark pairs with MRF regularization
Author :
Ou, Y. ; Besbes, A. ; Bilello, M. ; Mansour, M. ; Davatzikos, C. ; Paragios, N.
Author_Institution :
Dept. of Radiol., Sect. of Biomed. Image Anal. (SBIA), Univ. of Pennsylvania, Philadelphia, PA, USA
fYear :
2010
fDate :
14-17 April 2010
Firstpage :
400
Lastpage :
403
Abstract :
In this paper, we present a framework for extracting mutually-salient landmark pairs for registration. Traditional methods detect landmarks one-by-one and separately in two images. Therefore, the detected landmarks might inherit low dis-criminability and are not necessarily good for matching. In contrast, our method detects landmarks pair-by-pair across images, and those pairs are required to be mutually-salient, i.e., uniquely corresponding to each other. The second merit of our framework is that, instead of finding individually optimal correspondence, which is a local approach and could cause self-intersection of the resultant deformation, our framework adopts a Markov-random-field (MRF)-based spatial arrangement to select the globally optimal landmark pairs. In this way, the geometric consistency of the correspondences is maintained and the resultant deformations are relatively smooth and topology-preserving. Promising experimental validation through a radiologist´s evaluation of the established correspondences is presented.
Keywords :
Markov processes; medical image processing; MRF regularization; Markov-random-field-based spatial arrangement; globally optimal landmark pairs; mutually-salient landmark pairs; pair-by-pair across images; radiologist evaluation; resultant deformation; self-intersection; Biomedical imaging; Biomedical measurements; Data mining; Image analysis; Image registration; Mutual information; Optimization methods; Radiology; Image Registration; Landmark Matching; MRF; Mutual-Saliency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
Conference_Location :
Rotterdam
ISSN :
1945-7928
Print_ISBN :
978-1-4244-4125-9
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2010.5490324
Filename :
5490324
Link To Document :
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