DocumentCode :
2722966
Title :
Boundary scan test used at board level: moving towards reality
Author :
De Jong, Frans
Author_Institution :
Nederlandse Philips Bedrijven BV, Eindhoven, Netherlands
fYear :
1990
fDate :
10-14 Sep 1990
Firstpage :
235
Lastpage :
242
Abstract :
The author addresses the need for adapted design and test tools when using boundary scan in board-level circuit design and testing these assemblies. Test pattern generation is dealt with, the data flow around this generation software is discussed, and a format for test vectors is presented. Details are given for different approaches to test pattern generation, and a program for checking correctness of vectors is introduced. Also, a PC-based BST (boundary scan testing) validation tool capable of addressing the first needs of a designer is described. It is concluded that, although using BST pays off very rapidly, a lot of details in the total design and test trajectory have to be cleared up. Coupling between tools and availability of software capable of dealing with BST according to a selected strategy are items that have to be checked
Keywords :
automatic testing; circuit layout CAD; logic testing; microcomputer applications; printed circuit testing; PC-based BST; PCB testing; board-level circuit design; boundary scan testing; data flow; software availability; test pattern generation; test vectors; testing; validation tool; Assembly; Binary search trees; Circuit testing; Design engineering; Design for testability; Hardware; Manufacturing automation; Prototypes; Software testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
Type :
conf
DOI :
10.1109/TEST.1990.114022
Filename :
114022
Link To Document :
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