Title :
IDDQ testing because `zero defects isn´t enough´: a Philips perspective
Author :
Baker, Keith ; Verhelst, Bas
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
The application of IDDQ testing to CMOS devices at Philips is discussed. Philips´ major IC lab facilities in Europe and the United States have a long history of using IDDQ in production testing of high-volume CMOS SSI and MSI. The internally developed Philips digital component ATE (automatic test equipment), the LOCMOS tester, had the unique feature of an IDDQ capability of better than 1 μA on all channels. The need for a fast and sensitive IDDQ monitor is pointed out. An examination of the future of IDDQ from a device quality viewpoint indicates that the really critical issues for research into IDDQ are related to stress and accelerated life testing
Keywords :
CMOS integrated circuits; electric current measurement; integrated circuit testing; life testing; production testing; ATE; CMOS devices; IDDQ; IC testing; LOCMOS tester; MSI; Philips; SSI; accelerated life testing; monitor; production testing; stress; Automatic test equipment; Automatic testing; CMOS integrated circuits; Europe; History; Integrated circuit testing; Life estimation; Monitoring; Production; Stress;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114025
