• DocumentCode
    2723012
  • Title

    A gate drive circuit for silicon carbide JFET

  • Author

    Mino, Kazuaki ; Herold, Simon ; Kolar, J.W.

  • Author_Institution
    Power Electron. Syst. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
  • Volume
    2
  • fYear
    2003
  • fDate
    2-6 Nov. 2003
  • Firstpage
    1162
  • Abstract
    In this paper, a gate drive circuit for a 1300 V/4 A SiC-JFET is proposed and evaluated experimentally for a switching frequency of 200 kHz. Furthermore, a comparison of the switching behavior of a SiC-JFET/Si-MOSFET cascode and of the SiC-JFET driven by the proposed gate drive circuit is shown.
  • Keywords
    MOSFET; junction gate field effect transistors; power semiconductor switches; silicon compounds; switching circuits; wide band gap semiconductors; 1300 V; 200 kHz; 4 A; SiC; gate drive circuit; junction gate field effect transistors; metal-oxide-semiconductor field effect transistor; power semiconductors; silicon carbide JFET; switching behavior; switching frequency; Breakdown voltage; JFET circuits; Power semiconductor switches; Roentgenium; Silicon carbide; Switching circuits; Temperature; Thermal resistance; Tuned circuits; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2003. IECON '03. The 29th Annual Conference of the IEEE
  • Print_ISBN
    0-7803-7906-3
  • Type

    conf

  • DOI
    10.1109/IECON.2003.1280217
  • Filename
    1280217