Title :
Face recognizability evaluation for ATM applications with exceptional occlusion handling
Author :
Eum, Sungmin ; Suhr, Jae Kyu ; Kim, Jaihie
Author_Institution :
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
Abstract :
Biometrics has been extensively utilized to lessen the ATM-related crimes. One of the most widely used methods is to capture the facial images of the users for follow-up criminal investigations. However, this method is vulnerable to attacks made by the criminals with heavy facial occlusions. To overcome this drawback, this paper proposes a novel method for face recognizability evaluation with exceptional occlusion handling (EOH). The proposed method conducts a recognizability evaluation based on local regions of the facial components. Subsequently, the resulting decisions are reaffirmed by the EOH exploiting the global aspect of the frequently occurring facial occlusions. The EOH can be divided into two separate approaches: 1) accepting the falsely rejected cases, 2) rejecting the falsely accepted cases. In this paper, two typical facial occlusions, eyeglasses and sunglasses, are chosen to prove the validity of the EOH. To evaluate the proposed method in the most realistic environment, an ATM database was constructed by using an off-the-shelf ATM while the users were asked to make withdrawals as they would in real situations. The proposed method was evaluated by the ATM database which includes 480 video sequences with 20 subjects. The results showed the feasibility of the face recognizability evaluation with the EOH in practical ATM environments.
Keywords :
automatic teller machines; computer graphics; face recognition; video signal processing; ATM applications; ATM database; ATM-related crimes; exceptional occlusion handling; face recognizability evaluation; facial component local regions; video sequences; Asynchronous transfer mode; Databases; Detectors; Face; Face recognition; Image recognition; Mouth;
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2011 IEEE Computer Society Conference on
Conference_Location :
Colorado Springs, CO
Print_ISBN :
978-1-4577-0529-8
DOI :
10.1109/CVPRW.2011.5981883