An interactive environment for the transparent logic simulation and testing of integrated circuits

Author

Castrodale, Grant L. ; Dollas, Apostolos ; Krakow, William T.

Author_Institution

Dept. of Electr. Eng., Duke Univ., Durham, NC, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

394

Lastpage

403

Abstract

An interactive environment utilizing a knowledge-based system for the transparent testing of integrated circuits from simulation data has been developed. Unique features of this system are its modularity and its ease of expansion with new simulators and testers. The system uses the Omnitest language and a tester description language. The environment is fully operational and has been used to test several fabricated integrated circuits. An example illustrating the operation of the system is presented

Keywords

VLSI; automatic testing; high level languages; integrated circuit testing; interactive systems; knowledge based systems; logic CAD; logic testing; IC testing; Omnitest language; VLSI; interactive environment; knowledge-based system; modularity; pin map format; tester description language; testing of integrated circuits; transparent logic simulation; Automatic testing; Circuit simulation; Circuit testing; Environmental economics; Integrated circuit testing; Logic circuits; Logic testing; Performance evaluation; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114047

Filename

114047