Title :
Integrating Robust Technologies for Mixed-Signal System Level Test
Author_Institution :
Dept. of Electron., Tallinn Univ. of Technol.
Abstract :
An automated system-level test model approach is introduced, incorporating XML, while making use of interchangeable virtual instruments (IVI) and Automatic Test Markup Language (ATML) standards. Integrating basic block models into an automated test framework, targeting specifically mixed-signal ICs, the focus is on abstraction through integrating proven technologies in growing complexity levels. Initial research shows high potential for parallel development of system-level design and test models, thus reducing total production time
Keywords :
electronic engineering computing; hypermedia markup languages; integrated circuit design; virtual instrumentation; ATML standards; Automatic Test Markup Language; UML; XML; automated system-level test model; basic block models; design-for-test; interchangeable virtual instruments; mixed-signal ICs; mixed-signal system level test; parallel design; parallel test; robust technology integration; system-level design; Automatic testing; Circuit testing; Cost function; Electronic equipment testing; Instruments; Robustness; Software testing; System testing; System-level design; XML; ATML; UML; XML; automated test environment; basic block; design-for-test; interchangeable virtual instruments; mixed-signal; parallel design and test; system level test;
Conference_Titel :
Virtual Environments, Human-Computer Interfaces and Measurement Systems, Proceedings of 2006 IEEE International Conference on
Conference_Location :
La Coruna
Print_ISBN :
1-4244-0242-5
Electronic_ISBN :
1-4244-0243-3
DOI :
10.1109/VECIMS.2006.250798
