DocumentCode :
2723557
Title :
Ultralow impedance analysis and evaluation of power distribution network for decoupling capacitor embedded interposers of 3-D integrated LSI system
Author :
Kikuchi, Katsuya ; Ueda, Chihiro ; Gomyo, Toshio ; Ookubo, Toshikazu ; Aoyagi, Masahiro ; Sudo, Toshio ; Otsuka, Kanji
Author_Institution :
NeRI, Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1033
Lastpage :
1039
Abstract :
We evaluated low-impedance power distribution network (PDN) of decoupling capacitor embedded interposers for 3-D integrated LSI system. Measurements are carried out using the developed impedance analyzer system of a wide frequency range for evaluating ultralow impedance, and calculations are carried out using 2.5-D and 3-D finite element method (FEM) electromagnetic field simulator. We fabricated various types of capacitor mounted or capacitor embedded interposers test element group (TEG), such as surface-mounted and embedded chip capacitors, and thin film capacitors on silicon interposers using the same simple design to compare measurement results with calculation ones. As a result, the ultralow impedance evaluation system that has a high measurement dynamic range at the entire measurable frequency band can be realized. Furthermore, by using 2.5-D and 3-D FEM electromagnetic field simulator, it is expected that the accurate and wideband comparative verification of the PDN impedance analysis and evaluation can be realized.
Keywords :
embedded systems; finite element analysis; integrated circuit interconnections; large scale integration; surface mount technology; three-dimensional integrated circuits; 2.5D finite element method; 3D finite element method electromagnetic field simulator; 3D integrated LSI system; TEG; decoupling capacitor embedded interposers; embedded chip capacitors; impedance analyzer; power distribution network; surface mounting; test element group; thin film capacitors; ultralow impedance analysis; Capacitors; Finite element methods; Frequency measurement; Impedance; Impedance measurement; Semiconductor device measurement; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6248963
Filename :
6248963
Link To Document :
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