Title :
An Improvement on Optimal Testing Algorithm for Uniform Three Defective Coins
Author_Institution :
Dept. of Math. Sci., Xidian Univ., Xian
Abstract :
In this paper, given a balance scale and the information that there are exactly three uniform defective coins present, the authors consider the problem of ascertaining the minimum number of testing which suffice to identify out the three uniform defective coins in a set of n coins. An optimal testing algorithm for n is constructed, this algorithm respectively improves on both two optimal testing algorithms for infinitely many n´s constructed by Tosic and Bosnjak
Keywords :
finance; fraud; testing; defective coins; information-theoretic lower bound; optimal testing; standard coins; Circuit testing; Dynamic programming; Image coding; Image recognition; Industry applications; Mathematics; Pattern recognition; Printed circuits; Terminology; Defective coin; Information-theoretic lower bound; Standard coin; Testing algorithm;
Conference_Titel :
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location :
Dalian
Print_ISBN :
1-4244-0332-4
DOI :
10.1109/WCICA.2006.1712587
