DocumentCode
2723613
Title
An Improvement on Optimal Testing Algorithm for Uniform Three Defective Coins
Author
Mingnan Qi
Author_Institution
Dept. of Math. Sci., Xidian Univ., Xian
Volume
1
fYear
0
fDate
0-0 0
Firstpage
1442
Lastpage
1446
Abstract
In this paper, given a balance scale and the information that there are exactly three uniform defective coins present, the authors consider the problem of ascertaining the minimum number of testing which suffice to identify out the three uniform defective coins in a set of n coins. An optimal testing algorithm for n is constructed, this algorithm respectively improves on both two optimal testing algorithms for infinitely many n´s constructed by Tosic and Bosnjak
Keywords
finance; fraud; testing; defective coins; information-theoretic lower bound; optimal testing; standard coins; Circuit testing; Dynamic programming; Image coding; Image recognition; Industry applications; Mathematics; Pattern recognition; Printed circuits; Terminology; Defective coin; Information-theoretic lower bound; Standard coin; Testing algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
Conference_Location
Dalian
Print_ISBN
1-4244-0332-4
Type
conf
DOI
10.1109/WCICA.2006.1712587
Filename
1712587
Link To Document