• DocumentCode
    272385
  • Title

    Wavelet base selection for de-noising and extraction of partial discharge pulses in noisy environment

  • Author

    Altay, Özkan ; Kalenderli, Özcan

  • Author_Institution
    Avionics & Electr. Eng. Dept., Turkish Aerosp. Ind. (TAI), Ankara, Turkey
  • Volume
    9
  • Issue
    3
  • fYear
    2015
  • fDate
    5 2015
  • Firstpage
    276
  • Lastpage
    284
  • Abstract
    Wavelet-based de-noising is used to separate partial discharge (PD) signals from the noises resulting from measurement circuits or the surrounding environment. PD de-noising by using the wavelet shrinkage method is capable of separating the noise component to some extent, but the selection of the wavelet base has a remarkable effect on the de-noising results. The wavelet base is directly related to the distortion of the PD waveform and quality of the de-noising process. Although there are applications on PD noise separation in the literature, the selection of the wavelet base, which affects the evaluation of the PD characteristics, is still challenging. Instead of using correlation-based wavelet base selection for de-noising PD data, in this study a novel wavelet base selection method based on the most informative sub-band energy and entropy for separating noise from PD pulses is introduced and successfully applied to raw data obtained from the PD measurement set-up. The advantage of the proposed method is that the wavelet base selection solution is automatic and independent of the original noise-free pulse waveform. This study shows that the proposed method is useful for the extraction of noisy PD pulses by describing the basic discharge parameters such as discharge amplitude and the duration and time of occurrence more clearly.
  • Keywords
    entropy; partial discharge measurement; signal denoising; discharge amplitude; entropy; noisy environment; partial discharge signal extraction; subband energy; wavelet shrinkage method; wavelet-based denoising;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement & Technology, IET
  • Publisher
    iet
  • ISSN
    1751-8822
  • Type

    jour

  • DOI
    10.1049/iet-smt.2013.0114
  • Filename
    7089390