DocumentCode
2723875
Title
Extending binary searches to two and three dimensions [IC testing]
Author
Hickling, Robert L.
Author_Institution
Schlumberger Technol., San Jose, CA, USA
fYear
1990
fDate
10-14 Sep 1990
Firstpage
721
Lastpage
725
Abstract
An algorithm that is a variation on the standard binary search is presented, extending it to a two- or three-dimensional contour-following algorithm. The basic concept, problems, implementation, and efficiency achieved are discussed, along with some of the possibilities for automated characterization of integrated circuits
Keywords
automatic testing; computer graphics; graphical user interfaces; integrated circuit testing; 2D; 3D; IC testing; automatic testing; computer graphics; contour-following algorithm; graphic interface; standard binary search; Inspection; Integrated circuit testing; Shape;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114088
Filename
114088
Link To Document