Title :
Extending binary searches to two and three dimensions [IC testing]
Author :
Hickling, Robert L.
Author_Institution :
Schlumberger Technol., San Jose, CA, USA
Abstract :
An algorithm that is a variation on the standard binary search is presented, extending it to a two- or three-dimensional contour-following algorithm. The basic concept, problems, implementation, and efficiency achieved are discussed, along with some of the possibilities for automated characterization of integrated circuits
Keywords :
automatic testing; computer graphics; graphical user interfaces; integrated circuit testing; 2D; 3D; IC testing; automatic testing; computer graphics; contour-following algorithm; graphic interface; standard binary search; Inspection; Integrated circuit testing; Shape;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114088
