Title :
Cellular automata based self-test for programmable data paths
Author :
Van Sas, Jos ; Catthoor, Francky ; De Man, Hugo
Author_Institution :
IMEC Lab., Leuven, Belgium
Abstract :
A novel method for the generation of a set of predetermined test vectors on chip to be used as part of a BIST (built-in self-test) strategy for a class of data paths is presented. Given a set of faults and a corresponding set of test vectors which cover these faults, the corresponding self-test hardware will be generated automatically. For this purpose, use has been made of a cellular automaton which can be toggled between two rules. The CAD (computer-aided-design) program CAST accomplishes the synthesis of the cellular automaton, and the method has been applied to a data path used in the Cathedral-II/second silicon compilation environment. This technique makes it possible to obtain a BIST implementation with 100% stuck-at and stuck-open/close fault coverage for all detectable faults at the cost of an area overhead which is larger than that of conventional LFSR-(linear-feedback-shift-register) based methods but which is still acceptable
Keywords :
automatic testing; built-in self test; circuit layout CAD; fault location; finite automata; logic CAD; logic testing; BIST; CAD; CAST; Cathedral-II/second silicon compilation environment; area overhead; built-in self-test; cellular automaton; cost; data path; predetermined test vectors; programmable data paths; self-test; stuck at fault; stuck-open/close fault; synthesis; Automata; Automatic testing; Built-in self-test; Circuit faults; Electrical fault detection; Fault detection; Hardware; Laboratories; Read only memory; Test pattern generators;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114094
