• DocumentCode
    2723999
  • Title

    Design of signature circuits based on weight distributions of error-correcting codes

  • Author

    Iwasaki, Kazuhiko ; Yamaguchi, Noboru

  • Author_Institution
    Hitachi Ltd., Tokyo, Japan
  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    779
  • Lastpage
    785
  • Abstract
    Design techniques that can improve the aliasing probabilities of signature circuits for VLSI BIST (built-in self-test) are presented. The proposed techniques are based on the binary weight distributions of error-correcting codes over GF(2) and GF(2m). The technique considered for calculating the aliasing probability of signature circuits is appropriate for a vector supercomputer. Some of the calculations were done using the S810 supercomputer. The vectorization ratio of the program was 99.885% for an MISR (multiple-input signature register) with 16 inputs and for test length n=100-105
  • Keywords
    VLSI; built-in self test; error correction codes; logic CAD; logic testing; probability; shift registers; Hitachi; S810 supercomputer; VLSI BIST; aliasing probabilities; error-correcting codes; multiple-input signature register; signature circuits; vector supercomputer; vectorization ratio; weight distributions; Automatic testing; Built-in self-test; Circuit testing; Error correction codes; Laboratories; Polynomials; Probability; Supercomputers; Vectors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114095
  • Filename
    114095