DocumentCode
2723999
Title
Design of signature circuits based on weight distributions of error-correcting codes
Author
Iwasaki, Kazuhiko ; Yamaguchi, Noboru
Author_Institution
Hitachi Ltd., Tokyo, Japan
fYear
1990
fDate
10-14 Sep 1990
Firstpage
779
Lastpage
785
Abstract
Design techniques that can improve the aliasing probabilities of signature circuits for VLSI BIST (built-in self-test) are presented. The proposed techniques are based on the binary weight distributions of error-correcting codes over GF(2) and GF(2m). The technique considered for calculating the aliasing probability of signature circuits is appropriate for a vector supercomputer. Some of the calculations were done using the S810 supercomputer. The vectorization ratio of the program was 99.885% for an MISR (multiple-input signature register) with 16 inputs and for test length n =100-105
Keywords
VLSI; built-in self test; error correction codes; logic CAD; logic testing; probability; shift registers; Hitachi; S810 supercomputer; VLSI BIST; aliasing probabilities; error-correcting codes; multiple-input signature register; signature circuits; vector supercomputer; vectorization ratio; weight distributions; Automatic testing; Built-in self-test; Circuit testing; Error correction codes; Laboratories; Polynomials; Probability; Supercomputers; Vectors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1990. Proceedings., International
Conference_Location
Washington, DC
Print_ISBN
0-8186-9064-X
Type
conf
DOI
10.1109/TEST.1990.114095
Filename
114095
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