Title :
Analysis of failures on memories using expert system techniques
Author :
Viacroze, Thierry ; Lequeux, Marc
Author_Institution :
IBM France, Cestas, France
Abstract :
An expert system to assist in the diagnosis of failures on VLSI memories is presented. This expert system, using Prolog and implemented on an IBM PS/2, is intended to assist low-skilled people in finding and analyzing the faulty blocks responsible for the failures, as well as the data sheet parameters, which are sensitive. After a review of the requirements which dictated this technical choice, the expert system is described in detail. The level of performance is discussed, along with possible extensions
Keywords :
VLSI; automatic test equipment; automatic testing; expert systems; failure analysis; integrated circuit testing; integrated memory circuits; IBM PS/2; Prolog; VLSI memories; automatic testing; data sheet parameters; diagnosis of failures; expert system; parametric analysis; Computer networks; Expert systems; Failure analysis; Performance analysis; Procurement; Prototypes; Qualifications; Quality control; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114100
