• DocumentCode
    2724092
  • Title

    Gaussian mixtures for intensity modeling of spots in microscopy

  • Author

    Pan, Kangyu ; Kokaram, Anil ; Hillebrand, Jens ; Ramaswami, Mani

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Trinity Coll. Dublin, Dublin, Ireland
  • fYear
    2010
  • fDate
    14-17 April 2010
  • Firstpage
    121
  • Lastpage
    124
  • Abstract
    In confocal microscopy imaging, the target objects are labeled with fluorescent markers in the living specimen, and usually appear as spots in the observed images. Spot detection and analysis is an important task for the biological studies from the observed images. However, while the spots have irregular sizes and positions due to the variant amount of objects on each spot, the quantitative interpretation of the labeled objects is still heavily reliant on manual evaluation. In this paper, a novel shape modeling algorithm is proposed for automating the detection and analysis of the spots of interest. The algorithm exploits a Gaussian mixture model to characterize the spatial intensity distribution of the spots, and optimizes the model parameters using split-and-merge expectation maximization (SMEM) algorithm. As a result, a large amount of target objects with uncertain shapes can be analyzed in a systematic way.
  • Keywords
    Gaussian distribution; expectation-maximisation algorithm; feature extraction; medical image processing; optical microscopy; Gaussian mixture model; confocal microscopy; fluorescent markers; intensity modeling; shape modeling algorithm; spatial intensity distribution; split-and-merge expectation maximization; spot detection; spots of interest; Algorithm design and analysis; Biological system modeling; Brightness; Educational institutions; Electron microscopy; Fluorescence; Image analysis; Mathematical model; Proteins; Shape; Gaussian mixture model; mRNA; shape modeling; split-and-merge EM algorithm; spot analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2010 IEEE International Symposium on
  • Conference_Location
    Rotterdam
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4125-9
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2010.5490398
  • Filename
    5490398