Title :
The capability of capability indices with an application to guardbanding in a test environment
Author_Institution :
Harris Semicond., Melbourne, FL, USA
Abstract :
The author addresses 13 cautions associated with capability indices, covering the areas of computations, assumptions, applications. and interpretations. Some recommended uses are also provided. A naive guardbanding scheme using capability indices is presented and contrasted with a more traditional approach involving a bivariate normal model. A slight modification of the traditional approach, which views consumer loss from the consumer´s point of view, is proposed. Both the capability and modified traditional approaches are applied and contrasted in a semiconductor testing example. The capability approach is shown to be more conservative than the modified traditional approach
Keywords :
electronic equipment manufacture; electronic equipment testing; production testing; quality control; semiconductor device testing; QC; bivariate normal model; capability indices; computations; consumer loss; guardbanding; production testing; semiconductor testing; Acceleration; Computer applications; Current measurement; Manufacturing; Production; Sampling methods; Semiconductor device manufacture; Semiconductor device testing; Temperature distribution; Voltage;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114111