• DocumentCode
    2724263
  • Title

    Technique for transfer of analog prototypes (DV´s) to production

  • Author

    Palumbo, Michael P.

  • fYear
    1990
  • fDate
    10-14 Sep 1990
  • Firstpage
    916
  • Lastpage
    923
  • Abstract
    The author discusses several of the statistical analysis techniques available to both development and manufacturing engineering and how these techniques can be applied to assist in product characterization and introduction. It is pointed out that statistical analysis techniques, such as regression analysis and statistical capability studies, are useful in the characterization of a new design and its subsequent introduction into full-scale production. The benefits from these analyses include identification of potential yield-impacting parameters before significant manufacturing resources are committed to full-scale production; an understanding of how and where to attack yield issues, i.e., through parameter centering or variability reduction; possible reductions in test development times and production test costs through simplification of test lists, verified by regression and/or correlation analysis. By applying the techniques discussed, the time required to bring a new design into full production with a clear understanding of its capabilities and the interdependencies among its electrical parameters can be reduced
  • Keywords
    analogue circuits; correlation methods; design engineering; economics; electronic equipment manufacture; electronic equipment testing; production testing; statistical analysis; analog prototypes; correlation analysis; electrical parameters; manufacturing engineering; product characterization; production test costs; regression analysis; statistical analysis; statistical capability; test development times; variability reduction; yield; yield-impacting parameters; Analog circuits; Arithmetic; Circuit testing; Costs; Design engineering; Performance analysis; Performance evaluation; Production; Prototypes; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1990. Proceedings., International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-9064-X
  • Type

    conf

  • DOI
    10.1109/TEST.1990.114112
  • Filename
    114112