Development of a new standard for test

Author

Sebesta, William W. ; Verhelst, Bas ; Wahl, Michael G.

Author_Institution

IBM Corp., Endicott, NY, USA

fYear

1990

fDate

10-14 Sep 1990

Firstpage

988

Lastpage

993

Abstract

The authors present a general view of the development of a new standard for test data, the EDIF (Electronic Design Interchange Format) Test Extension. Owing to the large amount of data that have to be described, the focus is on the methodology which is used in the development process to show the efficiency and power of the new standard. A conceptual model describing the basic aspects of testing is shown, and the methods used to build up the information model are presented and examples given. The approach used leads to a standard which is well structured and easy to understand. In addition, the information model can be used for the evaluation of other standards and is essential for the integration of standards in the future

Keywords

automatic test equipment; automatic testing; electronic engineering computing; electronic equipment testing; production testing; standards; CAD; EDIF; Electronic Design Interchange Format; automatic testing; conceptual model; efficiency; electronic equipment testing; information model; production testing; standard; Automatic testing; Circuit testing; Laboratories; Logic testing; Power system modeling; Signal design; Software testing; Standards development; Test equipment; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114120

Filename

114120