Title :
Localizing brain interactions from rhythmic EEG/MEG data
Author :
Nolte, G. ; Holroyd, T. ; Carver, F. ; Coppola, R. ; Hallett, M.
Author_Institution :
Nat. Inst. of Health, Bethesda, MD, USA
Abstract :
The interpretation of MEG/EEG data in terms of brain connectivity is largely obscured by artefacts of volume conduction, i.e. by the fact that a single source is observable in many channels. Here, we analyze a measure which is insensitive to spurious connectivity arising from volume conducted "self-interaction". For rhythmic data such a measure can be given by the imaginary part of the cross-spectrum between EEG/MEG channels. For the derivation we essentially exploit that a signal is not time-lagged to itself. To localize the sources of this observed interaction we fit a model cross-spectrum consisting of N interacting dipoles to the sample cross-spectrum. The relation to the maximum likelihood estimator will be discussed in detail. The method is illustrated for MEG data of human alpha rhythm in eyes closed condition. The eigenvalues of the imaginary cross-spectrum clearly indicate the presence of at least 4 necessarily interacting sources. Fits of 2 to 6 dipoles in a realistic volume conductor all resulted in locations scattered in the mesial part of the occipital lobe.
Keywords :
bioelectric potentials; eigenvalues and eigenfunctions; electroencephalography; magnetoencephalography; maximum likelihood estimation; MEG data; brain connectivity; brain interaction; dipole model; eigenvalues; eyes closed condition; human alpha rhythm; imaginary cross-spectrum; maximum likelihood estimator; occipital lobe mesial part; rhythmic EEG data; source localization; volume conduction; Brain modeling; Conductors; Eigenvalues and eigenfunctions; Electroencephalography; Eyes; Humans; Maximum likelihood estimation; Rhythm; Scattering; Volume measurement; MEG; alpha-rhythm; connectivity; cross-spectrum; dipole model; volume conduction;
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
DOI :
10.1109/IEMBS.2004.1403330