A picosecond external electro-optic prober using laser diodes

Author

Shinagawa, Mitsuru ; Nagatsuma, Tado

Author_Institution

NTT LSI Lab., Kanagawa, Japan

fYear

1990

fDate

10-14 Sep 1990

Firstpage

1035

Lastpage

1039

Abstract

A compact and easy-to-handle optical prober developed for testing integrated circuits fabricated on any substrate is introduced. This prober is based on external electro-optic (EO) sampling using a semiconductor laser diode as an optical probing pulse source. The minimum detectable voltage is as small as 11 mV/√Hz, which is close to the shot noise limited value. Temporal resolution is 24 ps, which is limited by the optical probing pulsewidth. Comparison of the measured waveform of the EO sampling with that of a conventional electrical sampling oscilloscope shows excellent agreement between the two. The prober is successfully applied to waveform diagnosis at internal nodes in gigahertz-band analog integrated circuits

Keywords

electro-optical devices; integrated circuit testing; linear integrated circuits; measurement by laser beam; semiconductor junction lasers; waveform analysis; 24 ps; GHz band; analog integrated circuits; integrated circuits; internal nodes; laser diodes; measured waveform; optical probing pulse source; picosecond external electro-optic prober; pulsewidth; sampling; waveform diagnosis; Circuit testing; Diode lasers; Gunshot detection systems; Integrated circuit testing; Integrated optics; Optical noise; Optical pulses; Photonic integrated circuits; Sampling methods; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1990. Proceedings., International

Conference_Location

Washington, DC

Print_ISBN

0-8186-9064-X

Type

conf

DOI

10.1109/TEST.1990.114127

Filename

114127