Title :
Testable design and support tool for cell based test
Author :
Ogihara, Takuji ; Koseko, Yasushi ; Yonemori, Genichi ; Kawai, Hiroyuki
Author_Institution :
Mitsubishi Electr. Corp., Kanagawa, Japan
Abstract :
The authors describe a testable design method and the corresponding support tool for testing large-scale cells embedded on LSIs. The testable design method requires very little extra hardware to increase testability. The support tool enables users to test the large-scale cells by using already prepared test patterns. Consequently, test generation, and fault simulation times are decreased
Keywords :
cellular arrays; digital simulation; fault location; integrated circuit testing; integrated logic circuits; large scale integration; logic testing; LSI; fault simulation times; large-scale cells; logic testing; support tool; test generation; test patterns; testable design; Circuit faults; Circuit testing; Costs; Degradation; Design methodology; Hardware; Large-scale systems; Logic design; Logic testing; Sequential analysis;
Conference_Titel :
Test Conference, 1990. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9064-X
DOI :
10.1109/TEST.1990.114131
