DocumentCode
2724762
Title
Design and implementation of a custom verification environment for fault injection and analysis on an embedded microprocessor
Author
Ustaoglu, Buse ; Ors, Berna
Author_Institution
Istanbul Tech. Univ., Istanbul, Turkey
fYear
2015
fDate
April 29 2015-May 1 2015
Firstpage
256
Lastpage
261
Abstract
Embedded microprocessors are widely used in most of the safety critical digital system applications. A fault in a single bit in the microprocessors may cause soft errors. It has different affects on the program outcome whether the fault changes a situation in the application. In order to analyse the behaviour of the applications under the faulty conditions we have designed a custom verification system. The verification system has two parts as Field Programmable Gate Array (FPGA) and personnel computer (PC). We have modified Natalius open source microprocessor in order to inject stuck-at-faults into it. We have handled a fault injection method and leveraged it to increase randomness. On FPGA, we have implemented modified Natalius microprocessor, the fault injection method and the communication protocol. Then the “Most Significant Bit First Multiplication Algorithm” has been implemented on the microprocessor as an application. We have prepared an environment which sends inputs to and gets outputs from the Natalius microprocessor on PC part. Finally, we have analysed our application by injecting faults in specific location and random location in register file to make some classifications for effects of the injected faults.
Keywords
embedded systems; fault location; field programmable gate arrays; microprocessor chips; FPGA; Natalius open source microprocessor; PC; application behaviour analysis; communication protocol; custom verification environment design; custom verification environment implementation; embedded microprocessor; fault analysis; faulty conditions; field programmable gate array; most-significant bit first-multiplication algorithm; personnel computer; random location; register file; safetycritical digital system applications; soft errors; specific location; stuck-at-fault injection; Algorithm design and analysis; Circuit faults; Fault location; Hardware; Microprocessors; Random access memory; Registers; Analysis; Design; Fault Injection; Microprocessor;
fLanguage
English
Publisher
ieee
Conference_Titel
Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE), 2015 Third International Conference on
Conference_Location
Beirut
Print_ISBN
978-1-4799-5679-1
Type
conf
DOI
10.1109/TAEECE.2015.7113636
Filename
7113636
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