DocumentCode
2724939
Title
A framework for public/private collaboration on ATE
Author
Eckersley, Joseph E., III ; Bond, Michael S.
Author_Institution
Warner Robins Air Logistics Center, Warner Robins, GA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
4
Abstract
This paper will describe the Integrated Process Team developed between the US Air Force VDATS program team and the Lockheed Martin LM-STAR team. Independently, both groups have designed a common ATS solution to reverse the excessive life cycle sustainment costs associated with the proliferation of unique test systems throughout their customer base. Both groups recognized the similarities in instrumentation, hardware/software architectures and the overall program goals between the two programs. During the course of several investigative meetings, it became very apparent to the two groups that the only options facing each were to either compete or cooperate. Driven by their desire to support their common warfighter customer, the two groups formulated a strategy to investigate the cooperative path. What follows in this paper is a description of how the two groups overcame significant challenges to cooperation such as protecting intellectual property, preserving the competitive requirements of Government procurement, breaking down the misconceptions each party had of the other and setbacks/resolutions that have occurred in the first year of effort since signing the Team Charter in March 2009.
Keywords
aircraft instrumentation; automatic testing; industrial property; life cycle costing; ATE; Government procurement; Integrated Process Team; Lockheed Martin LM-STAR team; Team Charter; US Air Force VDATS program team; common ATS solution; hardware-software architecture; intellectual property protection; life cycle sustainment cost; public/private collaboration framework; unique test systems; warfighter customer base; Force; Hardware; Instruments; Production; Software; US Department of Defense; Weapons; ATS; LM-STAR; Lockheed Martin; US Air Force; VDATS; partnership;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613552
Filename
5613552
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