DocumentCode
2725132
Title
Characterisation of thermally poled multilayered silicate thin films
Author
An, H. ; Fleming, S.
Author_Institution
Opt. Fibre Technol. Centre, Univ. of Sydney, Sydney, NSW
fYear
2008
fDate
7-10 July 2008
Firstpage
1
Lastpage
2
Abstract
We report measurements of the spatial profile of the second-order optical nonlinearity induced in thermally poled silicate thin films. Contrary to the case of bulk silica, the nonlinearity was mainly located at surfaces and interfaces.
Keywords
nonlinear optics; optical multilayers; silicon compounds; bulk silica; multilayered silicate thin films; second order optical nonlinearity; spatial profile; thermally poled; Anodes; Australia; Glass; Microscopy; Optical films; Optical surface waves; Optical waveguides; Silicon compounds; Spatial resolution; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Opto-Electronics and Communications Conference, 2008 and the 2008 Australian Conference on Optical Fibre Technology. OECC/ACOFT 2008. Joint conference of the
Conference_Location
Sydney
Print_ISBN
978-0-85825-807-5
Electronic_ISBN
978-0-85825-807-5
Type
conf
DOI
10.1109/OECCACOFT.2008.4610559
Filename
4610559
Link To Document