DocumentCode
2725410
Title
Fiber-top atomic force microscope: A worthwhile challenge
Author
Smith, K. ; de Man, S. ; Zeijlemaker, H. ; Said, A.A. ; Dugan, M. ; Iannuzzi, D.
Author_Institution
Vrije Univ. Amsterdam, Amsterdam
fYear
2008
fDate
7-10 July 2008
Firstpage
1
Lastpage
4
Abstract
Fiber-top technology offers an unprecedented opportunity to bring atomic force microscopy outside research laboratories. In this paper we analyze the challenges this technology-transfer process is facing and we discuss why it is worth addressing them.
Keywords
atomic force microscopy; fibre optic sensors; fiber-top atomic force microscope; fiber-top cantilever; technology-transfer process; Atomic force microscopy; Atomic measurements; Fiber lasers; Laboratories; Optical coupling; Optical fiber couplers; Optical fiber devices; Optical fibers; Optical interferometry; Photodiodes;
fLanguage
English
Publisher
ieee
Conference_Titel
Opto-Electronics and Communications Conference, 2008 and the 2008 Australian Conference on Optical Fibre Technology. OECC/ACOFT 2008. Joint conference of the
Conference_Location
Sydney
Print_ISBN
978-0-85825-807-5
Electronic_ISBN
978-0-85825-807-5
Type
conf
DOI
10.1109/OECCACOFT.2008.4610573
Filename
4610573
Link To Document