• DocumentCode
    2725723
  • Title

    Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring

  • Author

    Kulkarni, Chetan ; Biswas, Gautam ; Koutsoukos, Xenofon ; Celaya, Jose ; Goebel, Kai

  • Author_Institution
    Dept. of EECS, Vanderbilt Univ., Nashville, TN, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper proposes the experiments and setups for studying diagnosis and prognosis of electrolytic capacitors in DC-DC power converters. Electrolytic capacitors and power MOS-FET´s have higher failure rates than other components in DC-DC converter systems. Currently, our work focuses on experimental analysis and modeling electrolytic capacitors degradation and its effects on the output of DC-DC converter systems. The output degradation is typically measured by the increase in Equivalent series resistance and decrease in capacitance leading to output ripple currents. Typically, the ripple current effects dominate, and they can have adverse effects on downstream components. A model based approach to studying degradation phenomena enables us to combine the physics based modeling of the DC-DC converter with physics of failure models of capacitor degradation, and predict using stochastic simulation methods how system performance deteriorates with time. Degradation experiments were conducted where electrolytic capacitors were subjected to electrical and thermal stress to accelerate the aging of the system. This more systematic analysis may provide a more general and accurate method for computing the remaining useful life (RUL) of the component and the converter system.
  • Keywords
    DC-DC power convertors; ageing; condition monitoring; electrolytic capacitors; failure analysis; power MOSFET; stochastic processes; thermal stresses; DC- DC power converters; adverse effects; aging; capacitance leading; capacitor degradation; electrical stress; electrolytic capacitors; equivalent series resistance; health monitoring; power MOSFET; stochastic simulation methods; thermal stress; Capacitance; Capacitors; Converters; Degradation; Hardware; Stress; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613596
  • Filename
    5613596