• DocumentCode
    2725756
  • Title

    Programming Flash Memory with boundary scan using general purpose digital instrumentation

  • Author

    Marchetti, Tarra Epstein ; Borroz, Terry

  • Author_Institution
    Syst. Test Group, Teradyne, Inc., North Reading, MA, USA
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support costs, are discussed.
  • Keywords
    automatic test equipment; boundary scan testing; digital instrumentation; flash memories; boundary scan; boundary scan vendor proprietary hardware; digital test instrumentation; flash memory programming; general purpose digital instrumentation; on board JTAG programming; Diffusion tensor imaging; Flash memory; Instruments; Integrated circuits; Pins; Programming; Registers; Boundary scan; Deep Serial Memory; Digital; Flash Memory; IEEE 1149.1; JTAG;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613599
  • Filename
    5613599
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2725756