Title :
Programming Flash Memory with boundary scan using general purpose digital instrumentation
Author :
Marchetti, Tarra Epstein ; Borroz, Terry
Author_Institution :
Syst. Test Group, Teradyne, Inc., North Reading, MA, USA
Abstract :
This paper details the on-board JTAG programming of a Flash Memory using typical digital test instrumentation found in test systems rather than various boundary scan vendor proprietary hardware. Advantages to this technique, such as reduction in required equipment and reduced integration and support costs, are discussed.
Keywords :
automatic test equipment; boundary scan testing; digital instrumentation; flash memories; boundary scan; boundary scan vendor proprietary hardware; digital test instrumentation; flash memory programming; general purpose digital instrumentation; on board JTAG programming; Diffusion tensor imaging; Flash memory; Instruments; Integrated circuits; Pins; Programming; Registers; Boundary scan; Deep Serial Memory; Digital; Flash Memory; IEEE 1149.1; JTAG;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613599
