DocumentCode :
2725784
Title :
Maximizing the measurement accuracy of digitized signals
Author :
Haney, Mike
Author_Institution :
Syst. Test Group, Teradyne, Inc., North Reading, MA, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Analysis of digitized waveforms requires an understanding of the limitations of the acquisition hardware, an understanding of how digital sampling interacts with the waveform shape, and an understanding of how the desired measurements are influenced by the sampling operation. By paying attention to these considerations and following some general guidelines an acquisition system can be tuned to get the most accurate results for each type of measurement. This paper provides guidelines for obtaining the best measurement results for digitized waveforms by highlighting the interactions between the waveform to be acquired, the acquisition system capturing the waveform, and the measurements desired.
Keywords :
data acquisition; signal detection; signal sampling; waveform analysis; acquisition hardware; acquisition system; digital sampling; digitized signal; digitized waveform analysis; measurement accuracy; Accuracy; Algorithm design and analysis; Hardware; Image edge detection; Instruments; Noise; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613600
Filename :
5613600
Link To Document :
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