DocumentCode
2725797
Title
Using a synthetic bus test instrument to reduce program costs
Author
Hoover, Robert L. ; Heide, Carl
Author_Institution
Teradyne, Inc., North Reading, MA, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
4
Abstract
This paper illustrates how serial buses have been emulated in the past and how, using synthetic bus technology, better test methods can reduce program life cycle costs.
Keywords
automatic test equipment; system buses; program life cycle costs; serial buses; synthetic bus test instrument; Emulation; Fixtures; Instruments; Protocols; Software; Testing; Weapons;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613601
Filename
5613601
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