Title :
Using a synthetic bus test instrument to reduce program costs
Author :
Hoover, Robert L. ; Heide, Carl
Author_Institution :
Teradyne, Inc., North Reading, MA, USA
Abstract :
This paper illustrates how serial buses have been emulated in the past and how, using synthetic bus technology, better test methods can reduce program life cycle costs.
Keywords :
automatic test equipment; system buses; program life cycle costs; serial buses; synthetic bus test instrument; Emulation; Fixtures; Instruments; Protocols; Software; Testing; Weapons;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613601
