DocumentCode
2725804
Title
A Wavelet-Fuzzy Logic Based System to Detect and Identify Electric Power Disturbances
Author
Chacón, M.I. ; Duran, J.L. ; Santiesteban, L.A.
Author_Institution
Power Electron. Lab., Chihuahua Inst. of Technol.
fYear
2007
fDate
1-5 April 2007
Firstpage
52
Lastpage
57
Abstract
In this paper a method to detect and classify typical electric power disturbances is presented. Voltage sags, swells, momentary outage and capacitor switching transient events (CSTs) are the electric disturbances considered in this work. Disturbance detection and some disturbance features are obtained by the discrete wavelet transform. These features are used in the design of a fuzzy rule classification system. Both methods, wavelet detection and the fuzzy classifier, are extensively tested on the detection and classification of several simulated electric disturbances. In particular, capacitor switching transients events (CSTs) are presented to validate the proposed methodologies. The performance of the wavelet-fuzzy logic system turned out to be 95% of correct identification. The performance of the fuzzy classifier outperforms a classifier based on crisp decisions also presented in this paper. This performance is acceptable compared with other methodologies reported in the literature with performances varying from 92% to 95%
Keywords
capacitor switching; discrete wavelet transforms; fuzzy logic; fuzzy set theory; power engineering computing; power system faults; signal classification; capacitor switching transient events; discrete wavelet transform; electric power disturbance detection; electric power disturbance identification; fuzzy rule classification system; power outage; voltage sag; voltage swells; wavelet-fuzzy logic based system; Capacitors; Discrete wavelet transforms; Electrical equipment industry; Fuzzy systems; Laboratories; Logic; Power electronics; Power quality; Variable speed drives; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence in Image and Signal Processing, 2007. CIISP 2007. IEEE Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
1-4244-0707-9
Type
conf
DOI
10.1109/CIISP.2007.369293
Filename
4221394
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