DocumentCode :
2725901
Title :
High frequency sampling oscilloscopes used for vector network analysis: Synthetic vector network analyzer
Author :
Waivio, Nathan
Author_Institution :
ATE Syst. Eng., Northrop Grumman, Rolling Meadows, IL, USA
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper is about using sampling oscilloscopes to perform Vector Network Analysis measurements. This paper discusses algorithms and hardware required to make vector network measurements and then compares the measurements on a simple low pass filter to measurements taken by a vector network analyzer. Oscilloscopes and digitizers have been steadily increasing in bandwidth. At the same time Interchangeable Virtual Instrument drivers have made porting software between different scopes a simple matter. These technologies make investments in algorithm development more cost effective. The algorithms have a longer life, lower costs to maintain, and ease of porting the algorithms to future scopes.
Keywords :
analogue-digital conversion; network analysers; oscilloscopes; signal sampling; virtual instrumentation; digitizer; high frequency sampling oscilloscope; interchangeable virtual instrument driver; synthetic vector network analyzer; vector network analysis measurement; Algorithm design and analysis; Calibration; Frequency measurement; Generators; Oscilloscopes; Scattering parameters; Algorithms; Oscilloscopes; Vector Network Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
ISSN :
1088-7725
Print_ISBN :
978-1-4244-7960-3
Type :
conf
DOI :
10.1109/AUTEST.2010.5613606
Filename :
5613606
Link To Document :
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