Title :
Efficient parametric modeling and analysis for backplane channel characterization
Author :
Gu, Xiaoxiong ; Han, Ki Jin ; Cracraft, Michael ; Donadio, Renato Rimolo ; Kwark, Young
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
May 29 2012-June 1 2012
Abstract :
This paper presents the applications of a statistical and parametric link simulation environment (SPLSE) in modeling and characterizing server backplane channels. Model-to-hardware correlation is demonstrated for a 15-inch 3 Gb/s single-ended channel and an 18-inch 12 Gb/s differential channel, respectively. Hardware validated equalization schemes are further applied to demonstrate error free NRZ signaling at 25 Gb/s for the rehabilitated 18-inch differential channel with a lower-loss dielectric material.
Keywords :
dielectric materials; integrated circuit modelling; backplane channel characterization; bit rate 12 Gbit/s; bit rate 25 Gbit/s; bit rate 3 Gbit/s; differential channel; error free NRZ signaling; hardware validated equalization schemes; lower-loss dielectric material; model-to-hardware correlation; parametric link simulation; parametric modeling; server backplane channels; single-ended channel; size 15 in; size 18 in; statistical link simulation; Backplanes; Computational modeling; Connectors; Copper; Correlation; Integrated circuit modeling; Scattering parameters;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2012.6249094
