Title :
On the capacity rates of two-dimensional runlength limited codes
Author :
Ye, Zhongxing ; Zhang, Zhen
Author_Institution :
Dept. of Appl. Math., Jiao Tong Univ., Shanghai, China
Abstract :
We give a rigorous proof of Etzion and Wei´s conjecture about the capacity rate of two-dimensional runlength limited codes. We also provide an alternative approach to compute the capacity rate
Keywords :
runlength codes; Etzion and Wei´s conjecture; capacity rates; proof; two-dimensional runlength limited codes; Binary codes; Eigenvalues and eigenfunctions; Entropy; Mathematics; Merging;
Conference_Titel :
Information Theory, 1995. Proceedings., 1995 IEEE International Symposium on
Conference_Location :
Whistler, BC
Print_ISBN :
0-7803-2453-6
DOI :
10.1109/ISIT.1995.535762
