Title :
Accurate Analysis Of Resonant Screen Imhomogeneities Modelling Integrated Circuit Devices
Author :
Andrenko, Andrey S. ; Nosich, Alexander I.
Author_Institution :
Institute of Radiophysics and Electronics, Acad. of Sci., Ukrainian SSR
Keywords :
Dielectrics; Equations; Integrated circuit modeling; Integrated circuit technology; Resonance; Resonator filters; Scattering; Slabs; Surface treatment; Tellurium;
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1990. ICMWFT '90. International Conference on
Conference_Location :
Beijing, China
DOI :
10.1109/ICMWFT.1990.711437
