DocumentCode
2726100
Title
Optimizing diagnostic verification processes
Author
Shannon, Russell ; Knecht, John
Author_Institution
Naval Air Syst. Command, Lakehurst, NJ, USA
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
Demonstrations of avionics system and subsystem diagnostic capability are performed before a system or subsystem is verified. This ordinarily happens during the system design and demonstration phase of a program. In the case of aircraft or ground vehicles, there are several subsystem demonstrations, followed by a single system-level event. By the time a system or subsystem is ready for a functional demonstration of its diagnostic capability, there is already significant programmatic inertia towards achieving the next programmatic or contractual milestone. There is typically not enough available manpower, time-on-system, or even funding to test every possible fault in a given system or subsystem. Indeed, testing only the "relevant" faults, which the system\´s diagnostics have been built to address, can be a hugely time-consuming effort. Due to these constraints, diagnostic demonstrations are sometimes not conducted in a scientifically robust manner. Sometimes, certain testing techniques are used in an effort to expedite testing. These techniques include: emulating hardware faults and their detection circuitry in software, selecting only those faults which are easy to test or guaranteed to work, and choosing faults which do not significantly stress the diagnostics system. This paper describes a survey of diagnostic program managers in an attempt to characterize, and suggest remedies for, the time and budget-constrained fashion in which avionics diagnostics systems are functionally demonstrated today.
Keywords
aircraft instrumentation; avionics; diagnostic expert systems; aircraft; avionics diagnostic systems; detection circuitry; diagnostic verification process; expedite testing; ground vehicles; hardware faults; programmatic inertia; relevant faults; single system-level event; subsystem diagnostic capability; time-consuming effort; Circuit faults; Companies; Government; Integrated circuit modeling; Personnel; Testing; Avionics diagnostics; M-demo; built-in test; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613617
Filename
5613617
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