Title :
ESD improvements for familiar automated handlers
Author :
Bernier, Joe ; Hesher, Bruce
Author_Institution :
Harris Semicond., Melbourne, FL, USA
Abstract :
Many older models of automated test handlers still in common usage were not designed with static prevention in mind and can present a severe ESD hazard to sensitive devices. This paper presents a set of upgrades to materials and grounding techniques to minimize the static environment associated with specific handlers.
Keywords :
automatic test equipment; automatic testing; earthing; electrostatic discharge; integrated circuit testing; protection; ATE; ESD hazard; ESD improvements; automated handlers; grounding techniques; static prevention; test handlers; Automatic testing; Electrostatic discharge; Grounding; Hazards;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1995
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
1-878303-59-7
DOI :
10.1109/EOSESD.1995.478275
