• DocumentCode
    2726180
  • Title

    Ordering and Elimination Based Component Learning Method

  • Author

    Pamudurthy, Sheetal Reddy ; Sekhar, C. Chandra

  • Author_Institution
    Dept. of CSE, IIT Madras, Chennai
  • fYear
    2009
  • fDate
    4-6 Feb. 2009
  • Firstpage
    99
  • Lastpage
    102
  • Abstract
    In this paper, we propose a component learning method to learn a set of Gaussian components that fit the given data distribution. An ordering and visualization technique called OPTICS and tests of multi normality are used in this method. We consider the applications of the proposed method to the tasks of classification and clustering. Here, the components are used to define a feature space to which the data points are transformed. In that feature space, classification is performed using linear support vector machines and clustering is performed using support vector clustering. The performance of the component learning method and its application to classification and clustering is demonstrated on synthetic datasets.
  • Keywords
    image classification; pattern clustering; support vector machines; Gaussian components; OPTICS; classification; clustering; data distribution; elimination based component learning method; linear support vector machines; ordering based component learning method; synthetic datasets; visualization technique; Data visualization; Gaussian distribution; Indium phosphide; Learning systems; Optical devices; Pattern recognition; Performance analysis; Support vector machine classification; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Pattern Recognition, 2009. ICAPR '09. Seventh International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4244-3335-3
  • Type

    conf

  • DOI
    10.1109/ICAPR.2009.103
  • Filename
    4782751