DocumentCode
2726180
Title
Ordering and Elimination Based Component Learning Method
Author
Pamudurthy, Sheetal Reddy ; Sekhar, C. Chandra
Author_Institution
Dept. of CSE, IIT Madras, Chennai
fYear
2009
fDate
4-6 Feb. 2009
Firstpage
99
Lastpage
102
Abstract
In this paper, we propose a component learning method to learn a set of Gaussian components that fit the given data distribution. An ordering and visualization technique called OPTICS and tests of multi normality are used in this method. We consider the applications of the proposed method to the tasks of classification and clustering. Here, the components are used to define a feature space to which the data points are transformed. In that feature space, classification is performed using linear support vector machines and clustering is performed using support vector clustering. The performance of the component learning method and its application to classification and clustering is demonstrated on synthetic datasets.
Keywords
image classification; pattern clustering; support vector machines; Gaussian components; OPTICS; classification; clustering; data distribution; elimination based component learning method; linear support vector machines; ordering based component learning method; synthetic datasets; visualization technique; Data visualization; Gaussian distribution; Indium phosphide; Learning systems; Optical devices; Pattern recognition; Performance analysis; Support vector machine classification; Support vector machines; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in Pattern Recognition, 2009. ICAPR '09. Seventh International Conference on
Conference_Location
Kolkata
Print_ISBN
978-1-4244-3335-3
Type
conf
DOI
10.1109/ICAPR.2009.103
Filename
4782751
Link To Document