DocumentCode
2726284
Title
High density compliant contacting technology for integrated high power modules in automotive applications
Author
Nenzi, Paolo ; Crescenzi, Rocco ; Dolgyi, Alexander ; Klyshko, Alexy ; Bondarenko, Vitaly ; Belfiore, Nicola Pio ; Balucani, Marco
Author_Institution
DIET, Univ. of Roma Sapienza, Rome, Italy
fYear
2012
fDate
May 29 2012-June 1 2012
Firstpage
1976
Lastpage
1983
Abstract
In this work it is described an high-density contacting technology that can replace wire bonding in power electronic applications, to overcome known limitation of bond wires liftoff occurring after several power cycles due to the difference in the coefficient of thermal expansion of silicon and aluminum. In the presented technology, MEMS (micro-electro-mechanics systems) micro-fabrication processes are used to realize contact structures that, pressed against the silicon dice, provide a reliable compliant contact. One advantage of this technology is that the contacts can be hosted on a printed circuit board that integrates the control circuitry for the power devices. This will reduce the footprint of power systems, like Integrated High Power Modules (IHPM). Reduced footprints are beneficial in applications where space is a concern, like the automotive industry. The description of the technological steps for building the contacting assembly is reported together with process conditions and electrical performances of two test structures.
Keywords
assembling; automotive electronics; lead bonding; microfabrication; micromechanical devices; power electronics; reliability; thermal expansion; IHPM; MEMS microfabrication processes; aluminum thermal expansion coefficient; automotive industry; compliant contact reliability; contacting assembly; control circuitry; high density compliant contacting technology; high-density contacting technology; integrated high power modules; microelectromechanical systems microfabrication process; power devices; power electronic applications; printed circuit board; silicon thermal expansion coefficient; test structures; wire bonding; Bonding; Contacts; Etching; Metals; Polymers; Silicon; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4673-1966-9
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2012.6249111
Filename
6249111
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