DocumentCode :
2726284
Title :
High density compliant contacting technology for integrated high power modules in automotive applications
Author :
Nenzi, Paolo ; Crescenzi, Rocco ; Dolgyi, Alexander ; Klyshko, Alexy ; Bondarenko, Vitaly ; Belfiore, Nicola Pio ; Balucani, Marco
Author_Institution :
DIET, Univ. of Roma Sapienza, Rome, Italy
fYear :
2012
fDate :
May 29 2012-June 1 2012
Firstpage :
1976
Lastpage :
1983
Abstract :
In this work it is described an high-density contacting technology that can replace wire bonding in power electronic applications, to overcome known limitation of bond wires liftoff occurring after several power cycles due to the difference in the coefficient of thermal expansion of silicon and aluminum. In the presented technology, MEMS (micro-electro-mechanics systems) micro-fabrication processes are used to realize contact structures that, pressed against the silicon dice, provide a reliable compliant contact. One advantage of this technology is that the contacts can be hosted on a printed circuit board that integrates the control circuitry for the power devices. This will reduce the footprint of power systems, like Integrated High Power Modules (IHPM). Reduced footprints are beneficial in applications where space is a concern, like the automotive industry. The description of the technological steps for building the contacting assembly is reported together with process conditions and electrical performances of two test structures.
Keywords :
assembling; automotive electronics; lead bonding; microfabrication; micromechanical devices; power electronics; reliability; thermal expansion; IHPM; MEMS microfabrication processes; aluminum thermal expansion coefficient; automotive industry; compliant contact reliability; contacting assembly; control circuitry; high density compliant contacting technology; high-density contacting technology; integrated high power modules; microelectromechanical systems microfabrication process; power devices; power electronic applications; printed circuit board; silicon thermal expansion coefficient; test structures; wire bonding; Bonding; Contacts; Etching; Metals; Polymers; Silicon; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2012.6249111
Filename :
6249111
Link To Document :
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