• DocumentCode
    2726284
  • Title

    High density compliant contacting technology for integrated high power modules in automotive applications

  • Author

    Nenzi, Paolo ; Crescenzi, Rocco ; Dolgyi, Alexander ; Klyshko, Alexy ; Bondarenko, Vitaly ; Belfiore, Nicola Pio ; Balucani, Marco

  • Author_Institution
    DIET, Univ. of Roma Sapienza, Rome, Italy
  • fYear
    2012
  • fDate
    May 29 2012-June 1 2012
  • Firstpage
    1976
  • Lastpage
    1983
  • Abstract
    In this work it is described an high-density contacting technology that can replace wire bonding in power electronic applications, to overcome known limitation of bond wires liftoff occurring after several power cycles due to the difference in the coefficient of thermal expansion of silicon and aluminum. In the presented technology, MEMS (micro-electro-mechanics systems) micro-fabrication processes are used to realize contact structures that, pressed against the silicon dice, provide a reliable compliant contact. One advantage of this technology is that the contacts can be hosted on a printed circuit board that integrates the control circuitry for the power devices. This will reduce the footprint of power systems, like Integrated High Power Modules (IHPM). Reduced footprints are beneficial in applications where space is a concern, like the automotive industry. The description of the technological steps for building the contacting assembly is reported together with process conditions and electrical performances of two test structures.
  • Keywords
    assembling; automotive electronics; lead bonding; microfabrication; micromechanical devices; power electronics; reliability; thermal expansion; IHPM; MEMS microfabrication processes; aluminum thermal expansion coefficient; automotive industry; compliant contact reliability; contacting assembly; control circuitry; high density compliant contacting technology; high-density contacting technology; integrated high power modules; microelectromechanical systems microfabrication process; power devices; power electronic applications; printed circuit board; silicon thermal expansion coefficient; test structures; wire bonding; Bonding; Contacts; Etching; Metals; Polymers; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4673-1966-9
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2012.6249111
  • Filename
    6249111