• DocumentCode
    2726287
  • Title

    A simplified model of mammography geometry for breast cancer imaging with electrical impedance tomography

  • Author

    Choi, Myoung H. ; Kao, Tzu-Jen ; Isaacson, David ; Saulnier, Gary J. ; Newell, Jonathan C.

  • Author_Institution
    Div. of Electr. & Comput. Eng., Kangwon Nat. Univ., Chunchon, South Korea
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    1310
  • Lastpage
    1313
  • Abstract
    One recent application area of EIT is the detection of breast cancer by imaging the conductivity and the permittivity distribution inside the breast. The present "gold standard" for breast cancer detection is X-ray mammography, and it is desirable that the EIT and the X-ray mammography use the same geometry. This work presents a simplified model of the mammography geometry for EIT imaging. The mammography geometry is modeled as a rectangular box with electrode arrays on the top and bottom planes. A forward model for the electrical impedance imaging problem is derived for the homogeneous conductivity distribution and validated by experiment using a phantom tank. The effect of unmodeled surface on the sides of the electrodes is studied.
  • Keywords
    bioelectric phenomena; biomedical electrodes; biomedical measurement; cancer; electric impedance imaging; electrical conductivity measurement; mammography; permittivity measurement; phantoms; tumours; breast cancer detection; breast cancer imaging; conductivity distribution imaging; electrical impedance imaging; electrical impedance tomography; electrode arrays; mammography geometry; permittivity distribution imaging; phantom tank; Breast cancer; Cancer detection; Conductivity; Geometry; Impedance; Mammography; Optical imaging; Solid modeling; Tomography; X-ray imaging; Breast cancer; EIT; Electrical impedance; Mammography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403412
  • Filename
    1403412