Title :
What can we do to stay current with technology?
Author :
Kirkland, Larry V.
Author_Institution :
WesTest Eng., Farmington, UT, USA
Abstract :
We need to focus on the exact cause of failure and perform prognostics during the test and repair cycle. Technology must change for test/diagnosis. With the advent of more robust microcircuits we need to think outside the box when if comes to testing. If we continue to perform diagnostics in the same manner, without considering other testing philosophies, we will continue to waste time and resources.
Keywords :
aerospace testing; fault diagnosis; integrated circuit testing; integrated circuits; diagnostics; microcircuit; prognostic; repair cycle; test cycle; Hardware; Humans; Instruments; Robustness; Sensors; Software; Testing;
Conference_Titel :
AUTOTESTCON, 2010 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-7960-3
DOI :
10.1109/AUTEST.2010.5613628
