• DocumentCode
    2726368
  • Title

    HLA-based parallel test grid simulation

  • Author

    Lei, Wang ; Yang-wang, Fang ; Xin, Xu ; Lei-gang, Hu

  • Author_Institution
    Eng. Sch., Air Force Eng. Univ., Xi´´an, China
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Reconfigured Parallel Test Grid (RPTG) technology advanced a novel theory to improve test and ATE using efficiency. In order to analyze the function and efficiency of RPTG, it is important to simulate the RPTG environment authentically. Based on parallel and reconfigured characteristic of RPTG, HLA-based layered analytic simulation architecture was put forward. This solution can exploit the parallelism of the analytic simulation applications and support them well; also test tasks could be distributed effectively and dynamically.
  • Keywords
    automatic testing; digital simulation; grid computing; parallel processing; ATE; HLA based parallel test grid simulation; analytic simulation applications; reconfigured parallel test grid technology; Analytical models; Computational modeling; Computer architecture; Computers; Schedules; Software; Test equipment; HLA; High-performance Simulation; Parallel Processing; RPTG;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2010 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-7960-3
  • Type

    conf

  • DOI
    10.1109/AUTEST.2010.5613631
  • Filename
    5613631