DocumentCode
2726368
Title
HLA-based parallel test grid simulation
Author
Lei, Wang ; Yang-wang, Fang ; Xin, Xu ; Lei-gang, Hu
Author_Institution
Eng. Sch., Air Force Eng. Univ., Xi´´an, China
fYear
2010
fDate
13-16 Sept. 2010
Firstpage
1
Lastpage
5
Abstract
Reconfigured Parallel Test Grid (RPTG) technology advanced a novel theory to improve test and ATE using efficiency. In order to analyze the function and efficiency of RPTG, it is important to simulate the RPTG environment authentically. Based on parallel and reconfigured characteristic of RPTG, HLA-based layered analytic simulation architecture was put forward. This solution can exploit the parallelism of the analytic simulation applications and support them well; also test tasks could be distributed effectively and dynamically.
Keywords
automatic testing; digital simulation; grid computing; parallel processing; ATE; HLA based parallel test grid simulation; analytic simulation applications; reconfigured parallel test grid technology; Analytical models; Computational modeling; Computer architecture; Computers; Schedules; Software; Test equipment; HLA; High-performance Simulation; Parallel Processing; RPTG;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2010 IEEE
Conference_Location
Orlando, FL
ISSN
1088-7725
Print_ISBN
978-1-4244-7960-3
Type
conf
DOI
10.1109/AUTEST.2010.5613631
Filename
5613631
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