DocumentCode
2726594
Title
Contents
fYear
2010
fDate
16-19 May 2010
Abstract
The following topics are dealt with: nanotechnology; nanodevices; opto devices; microwave devices; integrated circuits; microsystem technology; circuit design; circuit testing; system design; reliability physics; modeling; and simulation.
Keywords
circuit reliability; circuit testing; integrated circuits; microwave devices; nanotechnology; network synthesis; optoelectronic devices; circuit design; circuit testing; integrated circuits; microsystem technology; microwave devices; modeling; nanodevices; nanotechnology; opto devices; reliability physics; simulation; system design;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings (MIEL), 2010 27th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4244-7200-0
Type
conf
DOI
10.1109/MIEL.2010.5490557
Filename
5490557
Link To Document