Abstract :
The following topics are dealt with: nanotechnology; nanodevices; opto devices; microwave devices; integrated circuits; microsystem technology; circuit design; circuit testing; system design; reliability physics; modeling; and simulation.
Keywords :
circuit reliability; circuit testing; integrated circuits; microwave devices; nanotechnology; network synthesis; optoelectronic devices; circuit design; circuit testing; integrated circuits; microsystem technology; microwave devices; modeling; nanodevices; nanotechnology; opto devices; reliability physics; simulation; system design;
Conference_Titel :
Microelectronics Proceedings (MIEL), 2010 27th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-7200-0
DOI :
10.1109/MIEL.2010.5490557