Title :
Active cooling analysis of the micro pump used in IGBT power module
Author :
Ling Xu ; Yang Zhou ; Yang Zhang ; Bulong Wu ; Mingxiang Chen ; Xiaobing Luo ; Sheng Liu
Author_Institution :
Sch. of Mech. Sci. & Eng., Huazhong Univ. of Sci & Tech, Wuhan, China
fDate :
May 29 2012-June 1 2012
Abstract :
The problem of heat dissipation of high power electronics such as IGBT (Insulated Gate Bipolar Transistors) has puzzled us for long time. If the heat generated from the chips could not be eliminated away from the devices, the failure rate would rise rapidly. To deal with this problem, the micro pumps along with the microchannel embedded in the DBC substrate are proposed to remove the heat actively with high efficiency. In this paper, a 1200V 75A IGBT module was chosen to be investigated. The configuration, basic property and function of micro pump was briefly described. Then, the internal structure and detailed component were investigated by the method of dissection. Moreover, a finite element model was built to analyze the thermal performance of the new IGBT module integrated with two different kinds of microchannels and the thermal perfermance of this new IGBT module is studied by CFD (computational fluid dynamics). As shown in the results, the temperature decreased to less than 100°C. Besides, the temperature uniformity is around 1°C, a significant advantage for long term reliability.
Keywords :
computational fluid dynamics; cooling; insulated gate bipolar transistors; power bipolar transistors; semiconductor device reliability; CFD; IGBT power module; active cooling analysis; computational fluid dynamics; current 75 A; finite element model; heat dissipation; high power electronics; insulated gate bipolar transistors; micro pump; microchannels; voltage 1200 V; Cooling; Educational institutions; Heating; Insulated gate bipolar transistors; Microchannel; Substrates; Active Cooling; FEM; IGBT; Micro Pump; Modeling; Power Electronics;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2012 IEEE 62nd
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1966-9
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2012.6249133