DocumentCode :
2727080
Title :
Modeling power semiconductor losses in HEV powertrains using Si and SiC devices
Author :
Reed, Justin K. ; McFarland, James ; Tangudu, Jagadeesh ; Vinot, Emmanuel ; Trigui, Rochdi ; Venkataramanan, Giri ; Gupta, Shiv ; Jahns, Thomas
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin-Madison, Madison, WI, USA
fYear :
2010
fDate :
1-3 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Silicon carbide (SiC) power semiconductor devices are known to have potential benefits over conventional silicon (Si) devices, particularly in high power applications such as hybrid electric vehicles (HEVs). Recent literature studying the use of SiC JFETs in HEV inverters indicate a substantially increased gas mileage. This paper further investigates this change in inverter efficiency due to the adoption of SiC using analytical loss models and empirical loss data obtained from experimental Cree 1200V 10A DMOSFETs and Schottky diodes. A motor inverter efficiency map is developed and used in the VEHLIB simulator to evaluate fuel consumption benefits. Distribution of conduction and switching losses in both Si and SiC inverters is explored.
Keywords :
Schottky diodes; automotive electronics; elemental semiconductors; hybrid electric vehicles; invertors; junction gate field effect transistors; power MOSFET; power semiconductor diodes; power transmission (mechanical); silicon; silicon compounds; wide band gap semiconductors; DMOSFET; HEV inverter; HEV powertrain; JFET; Schottky diode; Si; SiC; VEHLIB simulator; analytical loss models; current 10 A; empirical loss data; fuel consumption; gas mileage; motor inverter efficiency map; power semiconductor loss modeling; voltage 1200 V; Inverters; MOSFETs; Semiconductor diodes; Silicon; Silicon carbide; Switching loss; Torque; Silicon carbide; ac-dc power conversion; power electronics; propulsion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicle Power and Propulsion Conference (VPPC), 2010 IEEE
Conference_Location :
Lille
Print_ISBN :
978-1-4244-8220-7
Type :
conf
DOI :
10.1109/VPPC.2010.5729068
Filename :
5729068
Link To Document :
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