Pattern classification of nevus with texture analysis

Author

Tanaka, T. ; Torii, S. ; Kabuta, I. ; Shimizu, K. ; Tanaka, M. ; Oka, H.

Author_Institution

Dept. of Appl. Phys. & Physico-Informatics, Keio Univ., Yokohama, Japan

Volume

1

fYear

2004

fDate

1-5 Sept. 2004

Firstpage

1459

Lastpage

1462

Abstract

The purpose of this research is to classify the pattern on the surface of the nevus. The digital image that contains one nevus is classified into three kinds of patterns of homogeneous pattern, globular pattern, and reticular pattern by the texture analysis. The tumor part in the image is specified first, and the specified tumor part is divided into some sub-images. Afterwards, the amount of the texture features of each sub-image was calculated. The pattern was classified by the discriminant analysis based on the amount of the texture features. As a result, the patterns could be classified correctly into three categories at the ratio of 94%.

Keywords

cancer; feature extraction; image classification; image texture; medical image processing; skin; tumours; digital image; globular pattern; homogeneous pattern; nevus surface; pattern classification; reticular pattern; texture analysis; texture features; tumor; Cancer; Digital images; Image analysis; Image texture analysis; Malignant tumors; Medical treatment; Metastasis; Pattern analysis; Pattern classification; Skin neoplasms; Pattern classification; nevus; texture analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-8439-3

Type

conf

DOI

10.1109/IEMBS.2004.1403450

Filename

1403450