DocumentCode :
2727236
Title :
The detection method of the silicon melting process in the CZ single-crystal furnace
Author :
Jiang Lei ; Liu Ding ; Zhao Yue ; Jiao Shang-Bin
Author_Institution :
Nat. United Crystal Growth Equip. & Syst. Integration Eng. Res. Center, Xi´an Univ. of Technol., Xi´an, China
fYear :
2013
fDate :
12-14 June 2013
Firstpage :
1358
Lastpage :
1362
Abstract :
The melting process is one of the main processes in the Czochralski method. Detecting the melting process is important for entire automation of the CZ crystal furnace. In regards to the furnace melting process, this paper presents a kind of image-based method to detect the size of the silicon ingot at later stages of the process. It could achieve the purpose of optimizing the heating power and process automation by monitoring the process. In the summary of the basic characteristic of the image of melting process, this paper proposes an image processing method which integrates silicon ingot color features, a multi-scale morphological gradient, an improved watershed transformation and the Bhattacharyya distance to separate the silicon ingots from the image background.
Keywords :
feature extraction; furnaces; image processing; ingots; integrated circuit manufacture; melting; monolithic integrated circuits; process monitoring; production engineering computing; Bhattacharyya distance; CZ single crystal furnace; Czochralski method; image background; image processing method; image-based method; ingot color features; multiscale morphological gradient; process monitoring; silicon ingot size detection; silicon melting process; Furnaces; Heating; Image edge detection; Reflection; Silicon; Surface morphology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Automation (ICCA), 2013 10th IEEE International Conference on
Conference_Location :
Hangzhou
ISSN :
1948-3449
Print_ISBN :
978-1-4673-4707-5
Type :
conf
DOI :
10.1109/ICCA.2013.6565036
Filename :
6565036
Link To Document :
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